SiO 2 /HfO 2 multilayers: impact of process parameters and stack geometry on the optical and structural properties

D. Patel, Peter Langston, A.S. Markosyan, E. Krous, B. Langdon, Federico J. Furch, Brendan A. Reagan, R. K. Route, M. M. Fejer, J. J. Rocca,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 10 citations · 0 references

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Abstract

We present a complete systematic study on the effect of assist beam energy on SiO<sub>2</sub>/HfO<sub>2</sub> quarter wave stacks deposited by dual ion beam sputter (DIBS) deposition. Increasing assist beam energy results in lower surface roughness and reduced micro-crystallinity. The coatings also show reduced mechanical stress. The improvements in the structural properties are accompanied by a reduction in the absorption loss and an increase in the laser resistance to damage at 1 &mu;m.