Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy - Concepedia

Concepedia

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Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy

25

Citations

10

References

2004

Year

Jorg Versluys, P. Clauws, Peter Nollet, S. Degrave, M. Burgelman

Thin Solid Films

Ii-vi SemiconductorElectrical EngineeringEngineeringDeep DefectsApplied PhysicsSemiconductor MaterialDefect FormationThin FilmsDefect TolerancePhotovoltaics

References

	Year	Citations

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