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Atomically accurate Si grating with 5.73 nm period
112
Citations
22
References
2001
Year
Transient GratingEngineeringIntegrated CircuitsSilicon On InsulatorVicinal SurfaceOptical PropertiesRegular Step PatternsSurface ReconstructionMaterials SciencePhotonicsPrecision MeasurementPhysicsCrystalline DefectsAtomic PhysicsTriple StepSemiconductor Device FabricationAccurate SiSilicon DebuggingSurface ScienceApplied PhysicsOptoelectronicsDiffractive Optic
A vicinal surface of silicon is found that exhibits an atomically accurate step pattern with a period of 5.73 nm, corresponding to 17 atomic rows per (111) terrace. It can be viewed as reconstructed Si(557) surface, where a triple step is combined with a single Si(111)7×7 unit. The driving forces for establishing regular step patterns are discussed.
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