In situ analysis of bismuth telluride electrodeposition using combined spectroscopic ellipsometry and electrochemical quartz crystal microbalance

An Algorithm for Least-Squares Estimation of Nonlinear Parameters

Donald W. Marquardt · Journal of the Society for Industrial and Applied Mathematics · 1963 · 30.4K citations

Natural Sciences, Computational Engineering, Optimization +11

Use of quartz vibration for weighing thin films on a microbalance

G. Sauerbrey, F. Sauerbrey · The European Physical Journal A · 1959 · 6.8K citations

Engineering, Materials Science, Physics +11

Thin-film thermoelectric devices with high room-temperature figures of merit

R. Venkatasubramanian, E. Siivola, T.S. Colpitts et al. · Nature · 2001 · 5.2K citations

Natural Sciences, Materials Engineering, Materials Science +14

The use of quarts oscillators for weighing thin layers and for microweighing

G. Sauerbrey, G. Sauerbrey · European Physical Journal A · 1959 · 4.5K citations

Engineering, Electrical Engineering, Physics +8

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

Natural Sciences, Physics, Optics +13