Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer - Concepedia

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Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer

50

Citations

45

References

2008

Year

Jianjun Hu, R. Wheeler, J.S. Zabinski, Paul A. Shade, A. Shiveley, Andrey A. Voevodin

Tribology Letters

Materials ScienceSurface CharacterizationEngineeringElectron MicroscopySurface ScienceApplied PhysicsThin FilmsSitu MicrotribometerThin Film Processing

References

	Year	Citations

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