Publication | Closed Access
Three-dimensional numerical analysis of mixed ionic and electronic conducting cathode reconstructed by focused ion beam scanning electron microscope
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Citations
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References
2010
Year
Materials ScienceThree-dimensional Numerical AnalysisEngineeringElectron MicroscopyMicroscopyApplied PhysicsElectronic Conducting CathodeElectron MicroscopeIon BeamFocused Ion BeamElectrochemistry
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