Publication | Closed Access
Interface structure and deuterium permeation properties of Er 2 O 3 /SiC multilayer film prepared by RF magnetron sputtering
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Citations
28
References
2015
Year
Materials EngineeringMaterials ScienceDeuterium Permeation PropertiesEngineeringOxide ElectronicsSurface ScienceApplied PhysicsEr 2Semiconductor MaterialInterface StructureThin Film ProcessingCarbide
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