Excess noise and refiring processes in thick-film resistors

Abstract

Excess noise in thick-film resistors fired 1 to10 times under the same firing profile was examined Changes in structure and composition, which are responsible for variations in sheet resistivity and temperature coefficient of resistance, also affect the noise index in thick-film resistors. Changes in the noise index depend on resistor composition and nature of the substrate. The excess noise correlates with physico-chemical phenomena induced by refiring in the bulk of the resistors.