Accelerator SIMS for trace element detection

An attempt to detect stable N- ions from a sputter ion source and some implications of the results for the design of tandems for ultra-sensitive carbon analysis

K.H. Purser, R.B. Liebert, A.E. Litherland et al. · Revue de Physique Appliquée · 1977 · 134 citations · Full text

Natural Sciences, Chemistry, Materials Science +11

Secondary ion mass spectrometry

C. Kenway-Jackson · Vacuum · 1984 · 51 citations

Natural Sciences, Chemistry, Materials Science +16

Advances in accelerator mass spectrometry

W. Wölfli · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1987 · 49 citations

Natural Sciences, Chemistry, Physics +11

Secondary ion mass spectrometry at close to single‐atom concentration using DC accelerators

K.H. Purser, A.E. Litherland, J. C. Rucklidge · Surface and Interface Analysis · 1979 · 41 citations

Natural Sciences, Chemistry, Analytical Chemistry +11

In situ trace element determination by AMS

J. C. Rucklidge, Graham C. Wilson, L.R. Kilius · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1990 · 20 citations

Natural Sciences, Chemistry, Earth Sciences +11