Concepedia
Journal of Applied Physics · 1963 · 28 citations · 6 references
PhysicsMicroscopyNatural SciencesParticle PhysicsApplied PhysicsMass AnalysisParticle MethodParticle TechnologyOptical Particle SizingMultiscale Modeling
First Page
6
A Mass Spectrometer for Isotope and Gas Analysis
A. O. Nier · Review of Scientific Instruments · 1947 · 557 citations
Gas Analysis, Engineering, Trace Element Geochemistry +17
Sputtering of Surfaces by Positive Ion Beams of Low Energy
Richard E. Honig · Journal of Applied Physics · 1958 · 260 citations
Engineering, Ion Beam Instrumentation, Vacuum Device +17
Systematic investigation of a magnetic ion source for an electromagnetic isotope separator
O. Almén, K.O. Nielsen · Nuclear Instruments · 1957 · 118 citations
Accelerator Mass Spectrometry, Physics, Magnetic Ion Source +4
Secondary Positive Ion Emission from Metal Surfaces
Richard C. Bradley · Journal of Applied Physics · 1959 · 92 citations
Materials Science, Surface Characterization, Engineering +15
On the Yield and Energy Distribution of Secondary Positive Ions from Metal Surfaces
H. E. Stanton · Journal of Applied Physics · 1960 · 45 citations
Engineering, Nuclear Physics, Positive Ions +16