Differential scanning calorimetry study of solid-state amorphization in multilayer thin-film Ni/Zr

Abstract

Differential scanning calorimetry (DSC) has been used to study solid-state amorphization and subsequent crystallization in sputtered multilayer Ni/Zr thin films. Initial results provide quantitative information about the thermodynamics and kinetics of these processes. An analysis of DSC data enables the activation energy and pre-exponential factor for interdiffusion of Ni and Zr in a-NiZr to be found.