Applied Optics · 2006 · 65 citations · 9 references
Natural SciencesMaterials SciencePhysicsMicrowave EngineeringOptical MaterialsOpticsCosmic Microwave BackgroundCosmic Microwave Background ObservationsRefractive IndexThin Film Optical PropertiesAccuracyOptical ConstantsOptical PropertiesPlate ModelingPolarization ModulatorsSubmillimeter Accuracy
We adopted an existing formalism and modified it to simulate, with high precision, the transmission, reflection, and absorption of multiple-plate birefringent devices as a function of frequency. To validate the model, we use it to compare the measured properties of an achromatic five-plate device with a broadband antireflection coating to expectations derived from the material optical constants and its geometric configuration. The half-wave plate presented here is observed to perform well with a phase shift variation of < 2 degrees from the ideal 180 degrees over a bandwidth of Deltav/v approximately 1 at millimeter wavelengths. This formalism represents a powerful design tool for birefringent polarization modulators and enables its optical properties to be specified with high accuracy.
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