Flux creep in Bi2Sr2CaCu2O8 epitaxial films

Abstract

We incorporate the experimentally deduced flux line potential well structure into the flux creep model. Application of this approach to the resistive transition in Bi2Sr2CaCu2O8 epitaxial films explains the power law voltage-current characteristics and the nonlinear current dependence of the activation energy. The results cannot be accounted for by a transition into a superconducting vortex-glass phase.