Publication | Closed Access
Low resistivity indium tin oxide films by pulsed laser deposition
156
Citations
13
References
1993
Year
Materials ScienceMaterials EngineeringElectrical EngineeringOptical MaterialsEngineeringOptical PropertiesOxide ElectronicsOptoelectronic MaterialsApplied PhysicsLaser ApplicationsOptoelectronic DevicesThin Film Process Technologyω CmThin FilmsPulsed Laser DepositionLaser-assisted DepositionOptoelectronicsThin Film Processing
Indium tin oxide films were grown by pulsed laser deposition on glass substrates. The electrical and optical properties of these films were studied. At optimized oxygen pressures, films with resistivity values of 1.4×10−4 and 5.6×10−4 Ω cm were deposited at substrate temperatures of 310 and 20 °C, respectively. Films with a thickness of 180 nm had a transmission of nearly 100% for the wavelength range of 600–800 nm.
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