Dependence of X-Ray Yields in Argon, Krypton, and Xenon upon the Charge State of Fluorine Ions at 35.7 MeV

Abstract

In high-velocity ion-atom single collisions, a strong dependence of target x-ray production cross sections upon the ionic charge state has been observed. Experiments were performed in thin gas targets of argon, krypton, and xenon with 35.7-MeV fluorine ions incident in charge states +5 to +9. Production cross sections for Ar $K$, Kr $L$, and Xe $L$ characteristic lines increase by as much as a factor of 5 with increasing incident charge state but cannot be fitted by a ${q}^{2}$ dependence.