Applied Physics Letters · 2012 · 28 citations · 24 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsPhotonicsDielectricsOptical Thin FilmsPhotonic Integrated CircuitsPhotonic MaterialsRefractive IndexSilicon PhotonicsBand GapBragg DiffractionDielectric Optical MaterialsPhotonic Band GapPhotonic Band StructurePorous SiliconRefractive Index ProfileSilicon Optical Properties
We report the design and fabrication of the complete visible range omnidirectional mirror, with a dielectric multilayered structure based on porous silicon (PS). The refractive index profile consisted of Bragg type chirped layers with an increasing thicknesses modulated by a potential envelop function f(x)=Cxk. The omnidirectional photonic band gap (OPBG) was measured from 396 to 805 nm, with more than 95% of the reflectivity, for 8° and 68°. The theoretical simulations based on the transfer matrix method along with a photographic sequence of the sample confirmed the OPBG for higher incident angles. It was enhanced by a factor of 19 as compared to the last reported visible region OPBG by PS dielectric multilayered structure.
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