Journal of Crystal Growth · 2014 · 38 citations · 46 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDefects In Electronic MaterialsSemiconductor DefectsSemiconductor Device MaterialsSemiconductor PhysicsSilicon MaterialsCarrier LifetimeCarrier Lifetime MeasurementDefect Levels In SemiconductorsMinority Carrier InjectionMinority Carrier Lifetime MeasurementSiliconSilicon DefectsSilicon Impurities
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Iron contamination in silicon technology
A. A. Istratov, H. Hieslmair, E. R. Weber · Applied Physics A · 2000 · 340 citations