Publication | Closed Access
Measurements of the debond energy for thin metallization lines on dielectrics
92
Citations
28
References
1996
Year
Materials ScienceElectromigration TechniqueMaterial AnalysisEngineeringDebond EnergyThin Metallization LinesApplied PhysicsMetallurgical InteractionElectron DiffractionElectrical PropertyElectrical Insulation
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