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Carrier effective masses in symmetrically strained (GaIn)As/Ga(PAs) multiple-quantum-well structures
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Citations
21
References
1995
Year
Materials ScienceIndividual Layer ThicknessesEngineeringPhotoluminescencePhysicsCarrier Effective MassesApplied PhysicsIncorporated Compressive StrainMultilayer HeterostructuresCategoryiii-v SemiconductorOptoelectronics
The carrier effective masses in symmetrically strained (GaIn)As/Ga(PAs) multiple-quantum-well heterostructures have been determined as a function of the incorporated compressive strain in the (GaIn)As quantum-well layer by applying magneto-optical studies. The precise structural parameters, i.e., individual layer thicknesses, strain values, and crystalline perfection, have been determined independently by high-resolution x-ray diffraction and transmission electron microscopy. By analyzing both the allowed and forbidden optical transitions as a function of the magnetic field, detected by polarization-dependent magnetophotoluminescence excitation spectroscopy, the exciton binding energy as well as the effective in-plane electron and heavy-hole masses have been determined quantitatively as a function of strain. The theoretically predicted significant decrease of the in-plane heavy-hole mass with increasing strain has been observed. The obtained results are discussed and compared with the contradictory results reported in the literature.
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