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A study of electron beam evaporated SiO2, TiO2, and Al2O2 films using RBS, HFS, and SIMS
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1990
Year
Materials ScienceMaterials EngineeringEngineeringElectron BeamAl2o2 FilmsOxide ElectronicsSurface ScienceApplied PhysicsVacuum DeviceThin FilmsChemical Vapor DepositionThin Film Processing
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