Inelastic electron lifetime in niobium films

Abstract

The perpendicular magnetoconductance has been measured for thin niobium films (${R}_{\ensuremath{\square}}$=47--218 \ensuremath{\Omega}) for temperatures from near the superconducting transition temperature ${T}_{c}$ to 20 K. The electron phase-coherence lifetime has been determined by analyzing magnetoconductance data, using the theories of localization and superconducting fluctuation effects in thin films. This electron lifetime is interpreted in terms of electron-electron and electron-phonon scattering mechanisms.