Journal of Applied Physics · 1962 · 194 citations · 6 references
EngineeringNuclear PhysicsComputer ArchitectureDefect ToleranceHardware SecurityReliability EngineeringQuantum MaterialsElectrical EngineeringHardware ReliabilityPhysicsCrystalline DefectsComputer EngineeringDefect FormationHexagonal NetworksSilicon DebuggingFault EnergyDislocation InteractionNatural SciencesCondensed Matter PhysicsApplied PhysicsElectron MicroscopeSmall Energy
In hexagonal networks in the (111) plane of silicon both families of nodes are ``extended.'' This implies that intrinsic as well as extrinsic stacking faults have small energy. The two stacking fault energies are ∼50 ergs/cm2 and ∼60 ergs/cm2. It is not possible at present to decide which energy belongs to which stacking fault. Both the etch pits, and the dislocations on which they are centered, can be revealed in the electron microscope.
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American Institute of Physics Handbook
Irving E. Dayton · American Journal of Physics · 1964 · 3K citations
Dislocation energies in anisotropic crystals
A.J.E. Foreman · Acta Metallurgica · 1955 · 385 citations