Publication | Closed Access
Backbond Oxidation of the Si(001) Surface: Narrow Channel of Barrierless Oxidation
257
Citations
16
References
1998
Year
Materials ScienceSemiconductorsSurface CharacterizationBackbond OxidationEngineeringSurface ChemistryBarrierless OxidationSurface ScienceApplied PhysicsSurface SiSemiconductor Device FabricationChemistrySilicon On InsulatorNarrow ChannelSpin-polarized Gradient ApproximationSurface ReactivitySemiconductor Device
Oxidation of the Si(001) surface was studied by the first principles calculation technique with spin-polarized gradient approximation. We have clarified the apparent barrierless reaction mechanism of the backbond oxidation of the surface Si by incoming ${\mathrm{O}}_{2}$ molecules. An ${\mathrm{O}}_{2}$ molecule does not attack directly the backbond but the oxidation occurs via metastable chemisorption states on the Si surface. We have also found that the triplet-to-singlet spin conversion is crucial in explaining the incident energy dependence of the sticking probability of ${\mathrm{O}}_{2}$ molecules.
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