Publication | Closed Access
A photo-electron and secondary ion mass spectrometric study of the chemical composition of thermal oxide layers on technically pure aluminium
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Citations
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References
1983
Year
Materials ScienceAluminium NitrideChemical EngineeringEngineeringCorrosionOxide ElectronicsOxidation ResistanceChemical CompositionPure AluminiumChemistryElemental MetalElemental CharacterizationThermal Oxide Layers
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