Publication | Closed Access
In situ study of thin film growth by internal stress measurement under ultrahigh vacuum conditions: Silver and copper under the influence of oxygen
44
Citations
12
References
1986
Year
Materials ScienceEngineeringSitu StudySurface ScienceApplied PhysicsUltrahigh Vacuum ConditionsInternal Stress MeasurementVacuum DeviceThin FilmsChemical DepositionChemical Vapor DepositionThin Film ProcessingMicrostructure
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