Current-perpendicular-to-plane-magnetoresistance properties of Ru and Co/Ru interfaces

Khalid Eid, R. J. Fonck, Muftah Darwish, W. P. Pratt, J. Bass

Journal of Applied Physics · 2002 · 58 citations · 16 references

Concepts

Abstract

Recent interest in Ru and Co/Ru multilayers stimulated us to measure their properties in the current-perpendicular-to-plane (CPP) geometry at 4.2 K. For sputtered samples, we present results for the resistivity of Ru, the interface specific resistances of Cu/Ru and Co/Ru, the spin-memory-loss length lsfRu in Ru, the spin-memory-loss probability at Cu/Ru interfaces, and the spin-scattering anisotropy parameter γ at Co/Ru interfaces.

References

16