Physical Review Letters · 1979 · 327 citations · 9 references
Natural SciencesElectrical EngineeringPhysicsElectronic MaterialsMetallic MaterialsThin FilmsElectrical CharacterizationElectrical ConductivityMetalsSuperconducting Thin FilmsThin Film Electrical PropertiesThin-film MaterialsConductionMetal Thin FilmsMetallic Thin FilmsResistivityResistivity MeasurementSheet ResistanceTemperature Dependence Of ResistanceTemperature-dependent Resistivity
Resistance measurements were made on high-resistivity thin-film metal strips at temperatures as low as 10 mK. Unexpected logarithmic variations of the resistance with temperature and applied electric field were observed for strips with sheet resistance below ${R}_{\ensuremath{\square}}\ensuremath{\sim}10$ k\ensuremath{\Omega}/\ensuremath{\square} and widths \ensuremath{\gtrsim} 1 \ensuremath{\mu}m. Exponential increases in resistance were observed for similar films when the film width was decreased to about 0.1 \ensuremath{\mu}m or when ${R}_{\ensuremath{\square}}$ was increased to \ensuremath{\sim} 10 k\ensuremath{\Omega}/\ensuremath{\square}.
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Maximum Metallic Resistance in Thin Wires
D. J. Thouless · Physical Review Letters · 1977 · 1.1K citations
Offset masks for lift-off photoprocessing
G. J. Dolan · Applied Physics Letters · 1977 · 692 citations