Applied Physics Letters · 2004 · 27 citations · 13 references
Natural SciencesElectrical EngineeringMaterials ScienceElectromagnetismMicrowave EngineeringThin FilmsMagnetic CharacterizationMagnetic Thin FilmsMagnetization ProcessesMicrowave MaterialsMicrowave MeasurementsThin Film Magnetic PropertiesAnisotropy FieldCharacterization Of Microwave MaterialsCoplanar WaveguidesMagnetization In Thin FilmsMetallic Thin FilmsResonant FrequencyResonant Frequency MeasurementSaturation Magnetization
The effect of finite coplanar waveguide (CPW) width on the measurement of the resonance frequency in thin ferromagnetic films has been characterized for pulsed inductive microwave magnetometry. A shift in resonant frequency is a linear function of the ratio of sample thickness to CPW width. The proportionality constant is experimentally determined to be 0.74±0.1 times the saturation magnetization of the film. The frequency shift may be modeled as arising from an effective magnetic-anisotropy field.
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