Publication | Closed Access
New Evidence for Defect Creation by High Optical Excitation in Glow Discharge Amorphous Silicon
137
Citations
5
References
1980
Year
Defect CreationOptical MaterialsEngineeringLuminescent GlassGlow DischargeHigh Optical ExcitationSilicon On InsulatorLuminescence PropertyOptical PropertiesEsr MeasurementsMaterials SciencePhotonicsElectrical EngineeringPhotoluminescenceNew EvidenceSemiconductor Device FabricationLow TemperaturesApplied PhysicsAmorphous SolidOptoelectronics
New evidence for creation of dangling bonds by high optical excitation at low temperatures is presented through the time-resolved luminescence measurements and ESR measurements in glow discharge amorphous silicon.
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