Publication | Closed Access
Processing and evaluation of metal gate/high-κ/Si capacitors incorporating Al, Ni, TiN, and Mo as metal gate, and ZrO2 and HfO2 as high-κ dielectric
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Citations
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References
2007
Year
Materials ScienceMaterials EngineeringElectrical EngineeringMetal GateEngineeringSemiconductor TechnologyOxide ElectronicsSemiconductor Device FabricationHigh-κ DielectricMicroelectronicsMetal Gate/high-κ/si CapacitorsSemiconductor Device
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