Physical Review Letters · 1992 · 214 citations · 13 references
EngineeringElectrical EngineeringPhysicsCondensed Matter PhysicsMicroelectronicsSemiconductor DevicesQuantum TunnelingQuantum Well DevicesQuantum WellsSemiconductor HeterostructuresSemiconductor InterfacesSemiconductor PhysicsCarrier Transport In Quantum WellsMagnetic Field InhomogeneityResonant TunnelingTransport In Quantum WellsTunneling CurrentTunneling DiodesTunneling In SemiconductorsTunneling Phenomena
We have observed a series of sharp peaks in the low-temperature I(V) characteristics of a gated 1 \ensuremath{\mu}m\ifmmode\times\else\texttimes\fi{}1 \ensuremath{\mu}m GaAs/(AlGa)As resonant tunneling diode, in which the gate is used to reduce the effective cross-sectional area from 0.7 to 0.1 \ensuremath{\mu}${\mathrm{m}}^{2}$. These peaks, which occur at voltages well below the calculated resonant threshold, show a weak dependence on temperature, magnetic field, and cross-sectional area. We argue that this subthreshold structure is due to an inhomogeneity in the device, which gives rise to a localized preferential current path, and we deduce that the spatial extent of the inhomogeneity is approximately 25 nm. The likely origin of the inhomogeneity is a background donor impurity in the quantum well.
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Resonant tunneling in semiconductor double barriers
L. L. Chang, L. Esaki, Raphael Tsu · Applied Physics Letters · 1974 · 1.9K citations