The Journal of Chemical Physics · 1965 · 157 citations · 19 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistryMolecular PhysicsOrganic ChemistryCrystallographyElectron DiffractionSecondary StructureStructural ElucidationStructure DeterminationX-ray CrystallographyBond AnglesBond LengthsDeuterium ChemistryDeuterium Isotope EffectDiffraction AnalysisDiffraction Pattern AnalysisElectron CrystallographyElectron Diffraction Intensities
An electron diffraction structure determination for ethane and deuteroethane has been carried out to study the magnitudes of primary and secondary deuterium isotope effects on bond lengths. Mean parameters and estimated standard errors for C2H6 were rg(C–H) = 1.1122±0.0012 Å, lg(C–H) = 0.0760±0.0010 Å, rg(C–C) = 1.5340±0.0011 Å, lg(C–C) = 0.0496±0.0010 Å, and ∠CCH = 111.0±0.2°. Corresponding parameters for C2D6 were rg(C—D) = 1.1071±0.0012 Å, lg(C—D) = 0.0668±0.0010 Å, rg(C–C) = 1.5323±0.0011 Å, lg(C–C) = 0.0517±0.0010 Å and ∠CCD = 111.0±0.2°. Shrinkage corrections have not been made for bond angles. A primary deuterium isotope effect of 0.0050±0.0006 Å was found for the carbon hydrogen bond. A possibly significant secondary effect was observed in which the C–C length in ethane exceeded that in deuteroethane by Δrg(1) = 0.0016±0.0007 Å. Some aspects of secondary isotope effects are discussed briefly.
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<i>Numerical Mathematical Analysis</i>
J. B. Scarborough, Joseph Hilsenrath · Physics Today · 1963 · 641 citations