Displacement Measurement by Image-processed Speckle Patterns

Abstract

Abstract The use of a commercial image-processing system in digital speckle-pattern interferometry is demonstrated. The possibilities of electronic-noise suppression and speckle-noise smoothing are discussed. Synthetic speckle patterns have been created and are shown to be useful in software development. Fringe skeletons have been extracted automatically from both synthetic and experimental correlation fringes giving accurate quantitative results.