Measurement · 1998 · 26 citations · 3 references
EngineeringAstronomyInstrumentationMetrologyAngle MeasurementAngular MeasurementDisplacement MeasurementInterferometryOptical InstrumentationAngular Displacement MeasurementAngular Measurement SystemsAngular MetrologyAngular Position MeasurementInterferometric InstrumentationInterferometric MeasurementOptical Interferometers
3
<title>Amplitude and phase calibration of accelerometers in the nanometer range</title>
Alfred Link, Joachim Gerhardt, Hans-Juergen von Martens · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1996 · 12 citations
Engineering, Electrical Engineering, Mechanical Engineering +17