Measurement and analysis of terahertz radiation from bulk semiconductors

Abstract

We report the recent measurement and analysis of the transmitted and pseudoreflected optically induced terahertz (THz) beams emitted from a semiconductor wafer under femtosecond laser illumination, where the static electric field is either parallel or perpendicular to the surface. In general, the amplitude of the transmitted THz field is different from that of pseudoreflected THz field, except at the Brewster angle.