Physical Review Letters · 1996 · 233 citations · 16 references
Natural SciencesElectrical EngineeringPhysicsCondensed Matter PhysicsMicroelectronicsThin FilmsElectron-phonon InteractionsMetalsNoiseNoise In Electronic DevicesNoise In Semiconductor DevicesThin Film Electrical PropertiesCurrent NoiseDevice Noise CharacterizationElectron-electron InteractionsElectron-phonon ScatteringNoise In ResistorsResistorsSemiconductor NoiseShot Noise
We have measured the current noise of silver thin-film resistors as a function of current and temperature and for resistor lengths of $7000$, $100$, $30$, and $1\ensuremath{\mu}\mathrm{m}$. As the resistor becomes shorter than the electron-phonon interaction length, the current noise for large current increases from a nearly current independent value to the interacting hot-electron value $(\sqrt{3}/4)2eI$. However, further reduction in length below the electron-electron interaction length decreases the noise to a value approaching the independent hot-electron value $(1/3)2eI$ first predicted for mesoscopic resistors.
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Introduction to Solid State Physics
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