Progress in the analysis of crystalline solids

Electron and ion spectroscopy of solids

Surface Science · 1977 · 168 citations

Natural Sciences, Chemistry, Materials Science +14

International Laboratory

A. I. MCMULLEN · Nature · 1969 · 74 citations · Full text

Characterization of Semiconductor Materials

Philip F. Kane, Graydon B. Larrabee, Stephen Knight · Journal of The Electrochemical Society · 1970 · 68 citations

Engineering, Materials Science, Physics +12

Secondary ion mass analysis, Technique for three-dimensional characterization

C. A. Evans · Analytical Chemistry · 1972 · 53 citations

Natural Sciences, Chemistry, Analytical Chemistry +12

Interface studies of Al<i>x</i>Ga1−<i>x</i>As-GaAs heterojunctions

C. M. Garne, Fei Su, Y. D. Shen et al. · Journal of Applied Physics · 1979 · 41 citations

Engineering, Materials Engineering, Materials Science +17