Tracer diffusion in amorphous Pd-Cu-Si

Abstract

Systematic measurements of W, Ir, Pt, Au, Hg, Tl, Pb, and Bi tracer diffusion have been performed in melt-spun amorphous ${\mathrm{Pd}}_{78}$${\mathrm{Cu}}_{6}$${\mathrm{Si}}_{16}$ ribbons. The impurities were introduced by ion implantation, and diffusional changes of the depth profiles were measured by Rutherford backscattering spectrometry. The observed differences in the diffusivities of various ions are discussed and compared with published data.