Publication | Closed Access
In-situ and elementally resolved determination of the thickness uniformity of multi-ply films by confocal micro XRF
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Citations
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References
2014
Year
Materials ScienceSurface CharacterizationMaterial AnalysisEngineeringMulti-ply FilmsSurface ScienceApplied PhysicsThickness UniformityThin FilmsConfocal Micro XrfMicrostructureThin Film ProcessingDepth-graded Multilayer Coating
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