SEM study of origin of Goss texture in Fe-3.25Si

Abstract

AbstractAbstractScanning electron microscopy (BSE mode) and selected-area channelling patterns have been used to determine the orientation, size, growth rate, and. nucleation sites of secondary grains in primary recrystallized Fe-3.35Si alloy sheet. Most secondary grains nucleate in a critical depth range of 10–80 μm below the sheet surface. In the material examined the nuclei originated below one of the surfaces only. Goss-orientation selection is achieved largely during the nucleation stage of secondary recrystallization although there is evidence for some further texture sharpening during growth. In the primary recrystallized material the largest grains are not heavily biased to the Goss orientation. It appears that the developmen t of a primary grain as a secondary nucleus requires some local environmental condition as well as a size advantage.