Thin Solid Films · 2000 · 30 citations · 18 references
EngineeringSitu Ellipsometric MeasurementsDifferential Scanning CalorimetrySurface ChemistryPhysicochemical AnalysisSurface ScienceApplied PhysicsKinetic ParametersChemistryMolecular KineticsTransformation KineticsChemical KineticsBiophysicsPt-silicide Formation
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Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer
Liang‐Yao Chen, Xing-Wei Feng, Yi Su et al. · Applied Optics · 1994 · 113 citations
Solid-Solid Reactions in Pt–Si Systems
Hiroki Muta, Daizaburo Shinoda · Journal of Applied Physics · 1972 · 74 citations