Coincidence Gate Utilization Factors for Neutron Correlation Counters With Up to Three Components in the Die-Away Profile

Abstract

We present analytical expressions for the gate utilization factors (GUFs), up to fourth order, for both signal triggered and random triggered histograms based on a three-component capture time profile. These are useful for refined design performance calculations of passive neutron multiplicity counters using shift register correlation analysis. To our knowledge, these expressions are new.