Solid-state NMR and ellipsometric investigations of C30 chains bonded to SiO2 surfaces

Abstract

The morphology of C30 alkyl chains bonded to different inorganic substrates such as fine ground glass particles, silica gel as well as silica wafers has been investigated by the combined use of solid-state NMR spectroscopy and ellipsometry. It could be shown that the average phase thickness of the bonded C30 layer of 29 Å is primarily dependent upon the employed polymeric surface reaction procedure and does not reflect the type of the employed inorganic substrate. A refined model of the C30 alkyl chain organization for solution polymerization on silica surfaces could be developed.