Ferroelectrics · 1992 · 22 citations · 7 references
Natural SciencesMaterials EngineeringMaterials ScienceAgingElectronic MaterialsSemiconductor DevicesAging EffectsDefect ModelingDefectsDefects In Electronic MaterialsDomain WallsSemiconductor DefectsAged Material BehaviourAging BehaviorAging Degradation AnalysisDomain Wall DepinningDomain Wall PinningDomain Wall Resistance
Abstract A model is proposed, which explains quantitatively the aging of material properties as domain wall clamping by orienting defects. The model is examined by aging measurements.
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