Direct Measurement of the Oscillation Frequency in an Optical-Tweezers Trap by Parametric Excitation

Joji Joykutty, Vaibhav Mathur, V. Venkataraman, Vasant Natarajan

Physical Review Letters · 2005 · 23 citations · 10 references

Concepts

Abstract

We demonstrate a novel technique for direct measurement of the oscillation frequency in an optical-tweezers trap. The technique uses the phenomenon of parametric resonance in an oscillator when the stiffness of the trapping potential is modulated. The trapped particle is a strongly damped oscillator; hence, the signature of parametric resonance is not an increase in the amplitude but an increase in the size of Brownian fluctuations. The trap frequency is measured with an accuracy of 0.1%, which is better than previous techniques and thus opens up new possibilities in experiments with optical tweezers.

References

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