Publication | Closed Access
Trace impurities analysis determined by neutron activation in the PbI2 crystal semiconductor
12
Citations
3
References
2003
Year
Materials ScienceTrace Impurities AnalysisEngineeringPhysicsPbi2 Crystal SemiconductorIntrinsic ImpurityApplied PhysicsSemiconductor MaterialDefect FormationNeutron Scattering
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