Electronics Letters · 1994 · 15 citations · 2 references
EngineeringComputer EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsDiagnosisDiagnosticsElectrical System DiagnosticsFault DetectionFault DiagnosisSmall-signal AnalysisCircuit Fault AnalysisCurrent-based Fault DiagnosisElectrical Fault DiagnosisFault AnalysisShort Circuit DetectionShort Circuit DiagnosisShort-circuit Fault Detection
Transistors with gate oxide shorts have been identified to 100% fault coverage in a CMOS opamp by monitoring supply current changes first using multilayer perceptrons and then Kohonen maps to resolve any ambiguities. A supervised forced organisation map allows the location and resistance of the short to be determined.
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Teuvo Kohonen · Proceedings of the IEEE · 1990 · 8.2K citations