AIP conference proceedings · 2009 · 21 citations · 1 references
EngineeringElectrical EngineeringPhysicsCondensed Matter PhysicsElectronic MaterialsSensorsElectrical ConductivityNoiseNoise In Electronic DevicesNoise In Semiconductor DevicesSensor NoiseSuperconducting Thin FilmsDevice Noise CharacterizationExcess NoiseNoise CharacterizationNoise In ResistorsPartial DerivativesTransition Edge SensorsTransition-edge Sensor Detectors
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Nikhil Jethava, Joel N. Ullom, Kent D. Irwin, W. B. Doriese, J. A. Beall, G. C. Hilton, L. R. Vale, Barry Zink; Dependence of Excess Noise on the Partial Derivatives of Resistance in Superconducting Transition Edge Sensors. AIP Conference Proceedings 16 December 2009; 1185 (1): 31–33. https://doi.org/10.1063/1.3292343 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search
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Nuclear instruments & methods in physics research
ScienceDirect · 1983 · 339 citations