2013 · 72 citations · 2 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyIii-v SemiconductorsBreakdown VoltageBuffer DesignBuffer LayersCarrier RecombinationCharge Carrier RecombinationChemical DiffusionDepth Profile AnalysisOpen-circuit Voltage
Efficiency of 9.2% on Cu <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> ZnSnS <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> submodule was achieved by applying hybrid buffer layer with combination of In-based buffer and Cd-based buffer layers. The hybrid buffer especially enhanced open circuit voltage. Finally world highest voltage of 758mV was achieved by this technique. The XPS depth profile showed there was remarkable diffusion of Cu and O as well as Cd and In. The UPS depth profile indicated that the hybrid buffer layer could improve carrier recombination at the interfaces not only between the buffer and the absorber layers but also between the i-ZnO and the buffer layers.
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Co-evaporated Cu2ZnSnSe4 films and devices
Ingrid Repins, Carolyn Beall, Nirav Vora et al. · Solar Energy Materials and Solar Cells · 2012 · 602 citations
Natural Sciences, Materials Engineering, Materials Science +10