Studies of Supported Nickel Catalysts Using Electron Spectroscopy (ESCA) and Ion Scattering Spectroscopy (ISS)

Milton. Wu, Roland L. Chin, David M. Hercules

Spectroscopy Letters · 1978 · 11 citations · 7 references

Concepts

Abstract

Abstract Supported nickel catalysts were studied by two surface sensitive techniques, ion scattering spectroscopy (ISS) and X-ray photoelectron spectroscopy (ESCA). The relationship between the signal intensity ratio of Ni/Al and the bulk nickel content was examined and compared by the two techniques, which have different sampling depths. The nature of the nickel species on the surface was analyzed by ESCA as the support was changed. The results show that comparative studies of ESCA and ISS can provide valuable information about the character of surface species on supported catalysts.

References

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